Scattering from a multilayered sample with correlated roughness.
The sample is composed of a substrate on which is sitting a stack of layers.
These layers consist in a repetition of 5 times two different superimposed layers (from bottom to top):
layer A: $2.5$ nm thick with a real refractive index $n = 5 \cdot 10^{-6}$.
layer B: $5$ nm thick with a real refractive index $n = 10 \cdot 10^{-6}$.
There is no added particle.
All layers present the same type of roughness on the top surface, which is characterized by:
a rms roughness of the interfaces $\sigma = 1$ nm,
a Hurst parameter $H$ equal to $0.3$,
a lateral correlation length $\xi$ of $5$ nm,
a common cross correlation length $\xi_{\perp}$ equal to $10$ nm,
a height distribution is normal.
The incident beam is characterized by a wavelength of 0.1 nm.
The incident angles are $\alpha_i = 0.2 ^{\circ}$ and $\varphi_i = 0^{\circ}$.